Learn about the significant advancements in electronics testing and production through a 30-minute MEPTEC conference talk exploring the evolution from algorithmic approaches to unsupervised machine learning techniques in semiconductor manufacturing and quality control.
Big Strides in Electronics Test and Production - From Algorithmic Methods to Unsupervised Machine Learning
Overview
Syllabus
Big strides in electronics test and production using algorithmic methods to unsupervised ML
Taught by
MEPTEC
