Panoptes IM - AI-Powered Image Metrology for Manufacturing Process Control

Watch a technical conference presentation from SK TECH SUMMIT 2023 exploring how Panoptes IM leverages AI for image metrology in semiconductor manufacturing. Learn about the critical role of computer vision technology in image-based measurements and discover innovative approaches from universal denoisers to augmented metrology. Gain insights into how nanometer-level image measurements can effectively control manufacturing processes, with detailed test results and future development plans. The speaker, Il-gu Kim from Gauss Labs (K-AI Alliance), brings extensive experience in video compression standardization, mobile/TV image analysis, and deep learning applications including object recognition, OCR, and scene analysis. His current focus on industrial AI aims to revolutionize manufacturing through advanced computer vision and image processing techniques.