AI-Powered Process Outcome Prediction Using Virtual Metrology

Learn about overcoming physical metrology limitations in high-volume manufacturing through a conference presentation from SK AI SUMMIT 2024. Explore how Gauss Labs' Panoptes VM (Virtual Metrology) product combines cutting-edge software technology, extensive data, and pioneering AI to address the challenges of physical measurement in manufacturing processes. Discover use cases demonstrating how to maximize manufacturing process visibility, presented by Simon Zabrocki, Senior Applied Scientist at Gauss Labs. With expertise in machine learning model development for semiconductor manufacturing data and academic credentials from Technische Universität München and Ecole Polytechnique, Zabrocki explains how AI-driven virtual metrology solutions can enhance manufacturing efficiency while addressing the cost, time, and space constraints of traditional measurement methods.