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Indexing, Quantitative analysis-continuation, Residual stress measurements
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Classroom Contents
Materials Characterization
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- 1 Properties of light, Image formation
- 2 Magnification and resolution
- 3 Depth of field,focus and field of view
- 4 Lens defects,filters and light microscopy introduction
- 5 Optical microscope demo., Bright field imaging, opaque specimen illumination
- 6 Opaque stop microscopy, Phase contrast microscopy
- 7 Dark field microscopy, Polarization microscopy
- 8 Differential interference contrast and fluorescence microscopy
- 9 Sample preparation techniques for optical microscopy
- 10 Tutorial problems
- 11 continuation-Tutorial problems
- 12 Introduction to scanning electron Microscopy
- 13 Lens aberrations, Object resolution, Image quality
- 14 Interaction between electrons and sample, Imaging capabilities
- 15 SEM and its mode of operation, Effect of aperture size,Working distance,condenser lens strength
- 16 SEM and its mode of operation- continuation
- 17 Factors affecting Interaction volume, Demonstration of SEM
- 18 Image formation and interpretation
- 19 Image formation and interpretation continued, EDS, WDS
- 20 Special contrast mechanisms, Monte Carlo simulations of Interaction volume
- 21 Electron channeling contrast imaging (ECCI), (EBSD)-Theory & instrument demonstration
- 22 Tutorial Problems on SEM
- 23 Basics of X-ray emission from source, electron excitation and X-ray interaction
- 24 Properties of X-rays
- 25 Bragg's Law Derivation
- 26 Diffraction relationship with reciprocal space
- 27 X-ray scattering
- 28 Factors affecting intensities of X-ray peaks
- 29 Factors affecting intensities of X-ray peaks- continuation
- 30 Effect of crystallite size and strain on intensity of X-rays
- 31 Profile fit, Factors affecting peak brodening
- 32 Indexing of diffraction pattern, Quantitative analysis
- 33 Indexing, Quantitative analysis-continuation, Residual stress measurements
- 34 XRD and Residual stress measurement- lab demonstration
- 35 Introduction to Transmission Electron Microscopy (TEM)
- 36 Fundementals of Transmission Electron Microscopy (TEM)
- 37 Basics of Diffraction-1
- 38 Basics of Diffraction-2
- 39 TEM imaging-1
- 40 TEM imaging-2
- 41 TEM instrument demonstration
- 42 TEM sample preparation-1-
- 43 TEM sample preparation-2
