Materials Characterization

Materials Characterization

nptelhrd via YouTube Direct link

Optical microscope demo., Bright field imaging, opaque specimen illumination

5 of 43

5 of 43

Optical microscope demo., Bright field imaging, opaque specimen illumination

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Classroom Contents

Materials Characterization

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  1. 1 Properties of light, Image formation
  2. 2 Magnification and resolution
  3. 3 Depth of field,focus and field of view
  4. 4 Lens defects,filters and light microscopy introduction
  5. 5 Optical microscope demo., Bright field imaging, opaque specimen illumination
  6. 6 Opaque stop microscopy, Phase contrast microscopy
  7. 7 Dark field microscopy, Polarization microscopy
  8. 8 Differential interference contrast and fluorescence microscopy
  9. 9 Sample preparation techniques for optical microscopy
  10. 10 Tutorial problems
  11. 11 continuation-Tutorial problems
  12. 12 Introduction to scanning electron Microscopy
  13. 13 Lens aberrations, Object resolution, Image quality
  14. 14 Interaction between electrons and sample, Imaging capabilities
  15. 15 SEM and its mode of operation, Effect of aperture size,Working distance,condenser lens strength
  16. 16 SEM and its mode of operation- continuation
  17. 17 Factors affecting Interaction volume, Demonstration of SEM
  18. 18 Image formation and interpretation
  19. 19 Image formation and interpretation continued, EDS, WDS
  20. 20 Special contrast mechanisms, Monte Carlo simulations of Interaction volume
  21. 21 Electron channeling contrast imaging (ECCI), (EBSD)-Theory & instrument demonstration
  22. 22 Tutorial Problems on SEM
  23. 23 Basics of X-ray emission from source, electron excitation and X-ray interaction
  24. 24 Properties of X-rays
  25. 25 Bragg's Law Derivation
  26. 26 Diffraction relationship with reciprocal space
  27. 27 X-ray scattering
  28. 28 Factors affecting intensities of X-ray peaks
  29. 29 Factors affecting intensities of X-ray peaks- continuation
  30. 30 Effect of crystallite size and strain on intensity of X-rays
  31. 31 Profile fit, Factors affecting peak brodening
  32. 32 Indexing of diffraction pattern, Quantitative analysis
  33. 33 Indexing, Quantitative analysis-continuation, Residual stress measurements
  34. 34 XRD and Residual stress measurement- lab demonstration
  35. 35 Introduction to Transmission Electron Microscopy (TEM)
  36. 36 Fundementals of Transmission Electron Microscopy (TEM)
  37. 37 Basics of Diffraction-1
  38. 38 Basics of Diffraction-2
  39. 39 TEM imaging-1
  40. 40 TEM imaging-2
  41. 41 TEM instrument demonstration
  42. 42 TEM sample preparation-1-
  43. 43 TEM sample preparation-2

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