It is the first course at the under graduate level on microstructural characterization of materials. This course will cover the basic principles and techniques of X-ray diffraction, optical, scanning electron and transmission electron microscopy along with demonstrations of the instrument details and imaging experiments through videos. This course also deals with the sample preparation techniques for the microstructural analysis with practical examples through videos.
Materials Characterization
Indian Institute of Technology Madras and NPTEL via Swayam
This course may be unavailable.
Overview
Syllabus
Week 1
1. Fundamentals of optics
2. Optical microscope and its instrumental details
Week 2
3. Variants in the optical microscopes and image formation
4. Phase contrast, Polarised light, Differential interference contrast, Fluorescence microscopy
Week 3
5. Sample preparation and applications of optical microscopes
Week 4
6. Introduction to Scanning electron microscopy (SEM)
Week 5
7. Instrumental details and image formation of SEM
Week 6
8. Various imaging techniques and spectroscopy
9. Sample preparation and applications of SEM
Week 7
10. Fundamentals of X-ray scattering
11. Bragg’s law derivation and the factors affecting the intensity
Week 8
12. Crystallite size, effect of strain on the intensity
13. Profile fit, indexing, peak broadening
Week 9
14. Quantitative analysis, residual stress analysis
15. Instrumentation details and demo experiments of XRD
Week 10
16. Introduction to transmission electron microscopy (TEM)
Week 11
17. Diffraction and image formation
18. Various imaging techniques and spectroscopy
Week 12
19. Sample preparation and applications of TEM
20. Instrumentation details and demo experiments of TEM
