Variational Methods in Image Processing and Advanced Materials Analysis - Kirk Lecture

Explore variational methods in image processing and advanced materials analysis in this Kirk Lecture by Prof. Irene Fonseca from Carnegie Mellon University. Delve into density measure models for image denoising and their applications in regularization techniques. Examine the formation and assembly patterns of semiconductor nanocrystals (quantum dots) and their significance in nanotechnology. Investigate how quantum dot size and shape influence optoelectronic properties and everyday applications. Learn about materials defects, their impact on rigidity and conductivity, and the evolution of quantum dot shapes. Discover insights into dislocation nucleation and motion in novel advanced materials.