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Multimodal Characterization of Wide Bandgap Semiconductor Wafers

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Overview

Join Dr. Francis Ndi, Global Product Line Manager at HORIBA Scientific, for a 59-minute webinar exploring the characterization of wide bandgap semiconductor wafers. Discover how these materials, with their high energy bandgaps corresponding to UV spectrum photon energies, enable critical applications in power generation, storage, and electric vehicle mobility. Learn about the importance of reducing chip costs through improved wafer yields, focusing on key parameters like uniformity and defectivity. Explore various spectroscopic characterization techniques including Raman, Photoluminescence, Time-Resolved Photoluminescence, and Cathodoluminescence, understanding their applications in assessing wafer performance for materials like Silicon Carbide (SiC) and Gallium Nitride (GaN). Master the unique challenges associated with wide bandgap semiconductor measurements and gain practical solutions for overcoming these obstacles in semiconductor characterization and analysis.

Syllabus

Multimodal Characterization of Wide Bandgap Semiconductor Wafers

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Labroots

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