Learn about critical chip-let interconnect testing and repair methodologies in this 36-minute invited conference talk presented by Sreejit Chakraverty from Ampere Computing at the Hot Interconnects Symposium. Explore essential techniques and strategies for maintaining and optimizing chip-let interconnections, gaining valuable insights into testing procedures and repair solutions that ensure reliable semiconductor performance.
Overview
Syllabus
Day 2 14:20: Invited Talk: Chip-let Interconnect Test and Repair
Taught by
HOTI - Hot Interconnects Symposium