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Explore advanced techniques for reconstructing 2D and 3D atomic structures using various types of Transmission Electron Microscopy (TEM) data in this informative lecture. Delve into the scattering of fast electrons by three-dimensional atomic arrangements and learn about different detection methods, including high-resolution imaging, diffraction patterns, and electron energy-loss spectra. Compare various approaches to measure phase shifts in electron beams and understand the advantages of techniques like ptychography and inline holography. Examine recent experimental results in retrieving 2D and 3D atomic arrangements in different materials systems, and discover methods to significantly reduce data storage requirements without compromising resolution. Gain valuable insights into cutting-edge microscopy techniques and their applications in materials science and nanotechnology.