Surface Microscopy and Microanalysis in Industrial Research - AVS e Talk

Explore surface microscopy and microanalysis techniques in an industrial research laboratory setting through this informative AVS e-Talk. Delve into the importance of surface analysis, focusing on the top few nanometers of a sample where most chemical reactions occur. Learn about surface functionalization for optimizing properties and improving device performance, as well as instances of surface degradation. Gain insights into three primary surface analysis techniques: Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), and Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS). Discover how these complementary methods provide crucial information about surface composition and microstructure. Examine typical data from these techniques and understand their role in resolving material problems and uncovering mechanisms. Additionally, get introduced to other surface analysis techniques available through external collaborations, broadening your understanding of the field.