Orthogonality Sampling Methods for Electromagnetic Inverse Scattering Problems
Society for Industrial and Applied Mathematics via YouTube
Overview
Explore electromagnetic inverse scattering problems in this one-hour virtual seminar from the 35th Imaging & Inverse Problems (IMAGINE) OneWorld SIAM-IS series. Delve into orthogonality sampling methods presented by Dr. Dinh-Liem Nguyen from Kansas State University. Learn about the advantages of these methods over classical sampling techniques, including simpler implementation, no need for regularizations, and increased robustness against data noise. Gain insights into recent research findings and examine numerical studies using 2D and 3D experimental data. Enhance your understanding of solving highly nonlinear and ill-posed inverse problems in electromagnetic scattering.
Syllabus
35th Imaging & Inverse Problems (IMAGINE) OneWorld SIAM-IS Virtual Seminar Series Talk
Taught by
Society for Industrial and Applied Mathematics